Mô tả sản phẩm

Scanning Electron Microscopes (SEM)

Scanning Electron Microscopes (SEM) scan a sample with a focused electron beam and deliver images with information about the samples’ topography and composition. CSEMs (conventional SEMs with a thermic electron source) and FE-SEMs (field emission SEMs with a field emission electron source) from Zeiss deliver high resolution surface information and superior materials contrast. Select your SEM out of a comprehensive portfolio of systems.

GeminiSEM

Effortless imaging – get sub-nanometer resolution and high detection efficiency, even in variable pressure mode – feel like you’re working in high vacuum.

Sigma Family

Combine field emission SEM (FE-SEM) technology with advanced analytics. Image particles, surfaces, and nanostructures. Save time with the semi-automated 4-step workflow of Sigma.

MultiSEM 505/506

With MultiSEM you unleash the acquisition speed of up to 91 parallel electron beams. Now, you can image samples in the centimeter – scale at nanometer resolution

MERLIN for Life Science

MERLIN is the ideal solution for complete image analysis and characterization of biological samples. With the highest beam current in a nanometer size spot, MERLIN provides the fastest imaging of large fields of view at FE-SEM resolution

MERLIN for Materials

MERLIN with the GEMINI II column combines ultra fast analytics, high resolution imaging using advanced detection modes, and future assured configuration flexibility on one single system

EVO for Life Sciences

Capture outstanding topographical details at low voltages with beam deceleration and high definition backscattered electron – BSE – imaging. Put EVO to work on a wide range of life science samples.

EVO for Materials

Capture outstanding topographical details at low voltages with beam deceleration and high definition backscattered electron imaging. Put your EVO to work on a wide range of material samples.